국제학술지
Adversarial autoencoder-based feature learning for fault detection in industrial processes
Kyojin Jang, Seokyoung Hong, Minsu Kim, Jonggeol Na, Il Moon, “Adversarial autoencoder-based feature learning for fault detection in industrial processes”, IEEE Transactions on Industrial Informatics, 2021. |
저널
DOI
10.1109/TII.2021.3078414
Impact factor
11.648 (JCR 1.83%)